Paper
16 April 2001 Inverse scattering with subwavelength resolution in the near-zone
Author Affiliations +
Abstract
In classical microscopy and inverse scattering, images are made from far field measurements. It will be shown that the standard Abbe or Rayleigh resolution limits arise as a result of assumptions which do not hold in the near field. Existing technologies such as TIRM and PSTM that exploit these properties of the near field produce two dimensional images which exhibit structure on a subwavelength scale. These images have proven difficult to interpret when the sample presents variations in structure and optical properties simultaneously in three dimensions. We present the analytic singular value decomposition of the linearized scattering operator. This representation leads to a robust inversion algorithm for the inverse scattering problem in the near zone. Numerical implementation of the algorithm is demonstrated using simulated noisy data to produce tomographic images of a three dimensional scatterer.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. Scott Carney and John C. Schotland "Inverse scattering with subwavelength resolution in the near-zone", Proc. SPIE 4261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing VIII, (16 April 2001); https://doi.org/10.1117/12.424517
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KEYWORDS
Near field

Inverse scattering

Scattering

3D image processing

Image resolution

Signal to noise ratio

Inverse scattering problem

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