New inverse computation for optical-absorption coefficient in semiconductor material

Jianxin Zhu

doi:10.1117/12.402636

9 October 2000 New inverse computation for optical-absorption coefficient in semiconductor material

Jianxin Zhu

Proceedings Volume 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications; (2000) https://doi.org/10.1117/12.402636
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

In this paper, for an inhomogeneous material in which the thermal conductivity is varied as a function of depth, we propose an efficient method to inversely compute the depth distribution of optical-absorption coefficient by the surface temperature of the material. The results of inverse computation by a group of surface temperature data show that some more accurate optical- absorption coefficients can be obtained.

Citation Download Citation

Jianxin Zhu "New inverse computation for optical-absorption coefficient in semiconductor material", Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); https://doi.org/10.1117/12.402636

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