Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

Guijun Hu; Jiawei Shi; Sumei Zhang; Yu Lu; LiYun Qi; Hongyan Li; Fenggang Zhang

doi:10.1117/12.401718

3 October 2000 Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality

Guijun Hu, Jiawei Shi, Sumei Zhang, Yu Lu, LiYun Qi, Hongyan Li, Fenggang Zhang

Author Affiliations +

Proceedings Volume 4220, Advanced Photonic Sensors: Technology and Applications; (2000) https://doi.org/10.1117/12.401718
Event: Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments, 2000, Beijing, China

Abstract

The low frequency electrical noise and electric derivative (IdV/dI-I) are measured at different conditions. The correlation between the noise and device quality is discussed, the results indicate that the low frequency electrical noise of 808 nm high power semiconductor laser is mainly 1/f noise and has good relation with device quality.

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Guijun Hu, Jiawei Shi, Sumei Zhang, Yu Lu, LiYun Qi, Hongyan Li, and Fenggang Zhang "Correlation between the low-frequency electrical noise of high-power quantum well lasers and device quality", Proc. SPIE 4220, Advanced Photonic Sensors: Technology and Applications, (3 October 2000); https://doi.org/10.1117/12.401718

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