Paper
22 January 2001 Establishment of production process and assurance method for alternating phase-shift masks
Shiaki M. Murai, Yasuhiro Koizumi, Tatsuhiko Kamibayashi, Hidetaka Saitou, Morihisa Hoga, Yasutaka Morikawa, Hiroyuki Miyashita
Author Affiliations +
Abstract
Alternating phase shift masks (altPSMs) are effective in reducing MEF. However, altPSMs have been used in device development, not in production, because phase-defect assurance has not been sufficient. An assurance method for 180- and 150-nm rule altPSMs was established by the use of both MD-2000 and KLA/STARlight. We have started production of defect-free altPSMs with quartz etched shifters and single trench structures by a two-step quartz etching process, which has an advantage of low phase-defect density.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shiaki M. Murai, Yasuhiro Koizumi, Tatsuhiko Kamibayashi, Hidetaka Saitou, Morihisa Hoga, Yasutaka Morikawa, and Hiroyuki Miyashita "Establishment of production process and assurance method for alternating phase-shift masks", Proc. SPIE 4186, 20th Annual BACUS Symposium on Photomask Technology, (22 January 2001); https://doi.org/10.1117/12.410772
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Cited by 1 scholarly publication and 1 patent.
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KEYWORDS
Photomasks

Etching

Scanning electron microscopy

Quartz

Inspection

Photography

Stereolithography

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