X-ray interferometric diffraction topography of crystal imperfections

Arsen O. Aboyan; Arpat S. Avanesyan

doi:10.1117/12.413684

25 January 2001 X-ray interferometric diffraction topography of crystal imperfections

Arsen O. Aboyan, Arpat S. Avanesyan

Proceedings Volume 4143, X-Ray FEL Optics and Instrumentation; (2001) https://doi.org/10.1117/12.413684
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

A method for X-ray interferometric investigation of the deformation field of crystal imperfections by means of double and triple interferometers is proposed. It is shown experimentally that using double and triple interferometers one can detect segregation lines, displacement lines, as well as the Moire patterns of imperfections of different types.

Citation Download Citation

Arsen O. Aboyan and Arpat S. Avanesyan "X-ray interferometric diffraction topography of crystal imperfections", Proc. SPIE 4143, X-Ray FEL Optics and Instrumentation, (25 January 2001); https://doi.org/10.1117/12.413684

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