High-resolution curvature sensing

Shirly Vinikman Pinchasi; Erez N. Ribak

doi:10.1117/12.407493

22 November 2000 High-resolution curvature sensing

Shirly Vinikman Pinchasi, Erez N. Ribak

Proceedings Volume 4124, High-Resolution Wavefront Control: Methods, Devices, and Applications II; (2000) https://doi.org/10.1117/12.407493
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

Curvature sensing is a non-interferometric wave front sensing method. Its resolution is only limited by the sensor resolution, and it only requires one pixel for each point. In order to understand its applicability it was tested in a controlled laboratory environment. We tried various optical configurations and different data processing methods, such as Projection on convex sets and finite elements. In edition it is presented that a simple silicon wafer, on the back of which porous silicon is etched, can serve as deformable mirror. This is the first report, to our knowledge, of the piezoelectric and piezo-optic response of porous silicon.

Citation Download Citation

Shirly Vinikman Pinchasi and Erez N. Ribak "High-resolution curvature sensing", Proc. SPIE 4124, High-Resolution Wavefront Control: Methods, Devices, and Applications II, (22 November 2000); https://doi.org/10.1117/12.407493

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