Paper
4 December 2000 Sparsity vs. statistical independence from a best-basis viewpoint
Naoki Saito, Brons M. Larson, Bertrand Benichou
Author Affiliations +
Abstract
We examine the similarity and difference between sparsity and statistical independence in image representations in a very concrete setting: use the best basis algorithm to select the sparsest basis and the least statistically- dependent basis from basis dictionaries for a given dataset. In order to understand their relationship, we use synthetic stochastic processes as well as the image patches of natural scene. Our experiments and analysis so far suggest the following: 1) Both sparsity and statistical independence criteria selected similar bases for most of our examples with minor differences; 2) Sparsity is more computationally and conceptually feasible as a basis selection criterion than the statistical independence, particularly for dat compression; 3) The sparsity criterion can and should be adapted to individual realization rather than for the whole collection of the realizations to achieve the maximum performance; 4) The importance of orientation selectivity of the local Fourier and brushlet dictionaries was not clearly demonstrated due to the boundary effect caused by the folding and local periodization.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Naoki Saito, Brons M. Larson, and Bertrand Benichou "Sparsity vs. statistical independence from a best-basis viewpoint", Proc. SPIE 4119, Wavelet Applications in Signal and Image Processing VIII, (4 December 2000); https://doi.org/10.1117/12.408635
Lens.org Logo
CITATIONS
Cited by 14 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Associative arrays

Stochastic processes

Wavelets

Image processing

Statistical analysis

Algorithm development

Independent component analysis

Back to Top