Diagnostics and growth of organic thin films for electro-optic modulators with low-driving voltage

Zhifu Liu; Sergey S. Sarkisov; Michael J. Curley; Alexander Leyderman; Yulong Cui; Javier Wu Li; Benjamin G. Penn

doi:10.1117/12.401644

29 September 2000 Diagnostics and growth of organic thin films for electro-optic modulators with low-driving voltage

Zhifu Liu, Sergey S. Sarkisov, Michael J. Curley, Alexander Leyderman, Yulong Cui, Javier Wu Li, Benjamin G. Penn

Proceedings Volume 4098, Optical Devices and Diagnostics in Materials Science; (2000) https://doi.org/10.1117/12.401644
Event: International Symposium on Optical Science and Technology, 2000, San Diego, CA, United States

Abstract

The focus of this paper is the characterization of electro- optic properties of single crystal thin films of organic material NPP grown by the plate-guided method. Characterization was performed using the longitudinal a.c. modulation technique. Half-wave voltage V_(pi ), figure-of- merit F, and electro-optic coefficient r₆₃ were estimated to be 3.24 kV, 0.98 X 10^-10 m/V and 25.8 MUL 10^-12 m/V respectively. We found that crystalline z-axis is off the normal to the plane of the film at an angle of 7⁰. We also proposed a transverse version of a thin film electro-optic modulator with low driving voltage, which is based on a single-arm thin film waveguide interferometer.

Citation Download Citation

Zhifu Liu, Sergey S. Sarkisov, Michael J. Curley, Alexander Leyderman, Yulong Cui, Javier Wu Li, and Benjamin G. Penn "Diagnostics and growth of organic thin films for electro-optic modulators with low-driving voltage", Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); https://doi.org/10.1117/12.401644

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