Partial plane level of terrace and its test

Yanan Liu; JianKang Zeng; Jun-Qi Liu; Tong S. Wu

doi:10.1117/12.389415

30 June 2000 Partial plane level of terrace and its test

Yanan Liu, JianKang Zeng, Jun-Qi Liu, Tong S. Wu

Proceedings Volume 4079, Display Technologies III; (2000) https://doi.org/10.1117/12.389415
Event: Photonics Taiwan, 2000, Taipei, Taiwan

Abstract

At present, the way to test plane level of terrace are all indirect survey methods at first, author choose some survey sections and get dates from these sections according to stipulation with survey method and then proceeding the dates, through which can strive the plane level error. The plane level dates calculated with these dates can't make an overall plane level assessment to the terrace, especially to the partial position so, it can't be described in detail on all terrace because of not been survived usually. Author all the error and plane level in the partial range the partial plane level, its assessment is very important to control the microcosmic quality. The paper also discuss the theory issue on speckle method and plane fluctuate capacity method with exist for a long term.

Citation Download Citation

Yanan Liu, JianKang Zeng, Jun-Qi Liu, and Tong S. Wu "Partial plane level of terrace and its test", Proc. SPIE 4079, Display Technologies III, (30 June 2000); https://doi.org/10.1117/12.389415

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available