Paper
22 May 2000 DSPI technique for nanometer vibration mode measurement
Author Affiliations +
Proceedings Volume 4072, Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (2000) https://doi.org/10.1117/12.386740
Event: 4th International Conference on Vibration Measurement by Laser Techniques, 2000, Ancona, Italy
Abstract
A time-average DSPI method for nanometer vibration mode measurement is presented in this paper. The phase continuous scan technique is combined with the Bessel fringe-shifting technique to quantitatively analyze the vibration mode by time-average DSPI is used in measurement system. Through the phase continuous scan, the background and speckle items are completely eliminated, which improves the fringe quality and enhances the signal-to-noise ratio of interferogram. There is no need to calibrate the optical phase-shifter exactly in this method. The anti-disturbance capability of this method is higher than that of the phase-stepping technique, so it is robust and easy to be used. In the vibration measurement system, the speckle average technology is used, so the high quality measuring results are obtained.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kaiduan Yue, Shuhai Jia, and Yushan Tan "DSPI technique for nanometer vibration mode measurement", Proc. SPIE 4072, Fourth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (22 May 2000); https://doi.org/10.1117/12.386740
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KEYWORDS
Speckle

Vibrometry

Phase shifts

Calibration

Bessel functions

Signal to noise ratio

Ultrasonics

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