Local intensity tests for optimal detectability

LiKang Yen; Sashidhar Bhikkaji; Jose C. Principe

doi:10.1117/12.396341

24 August 2000 Local intensity tests for optimal detectability

LiKang Yen, Sashidhar Bhikkaji, Jose C. Principe

Proceedings Volume 4053, Algorithms for Synthetic Aperture Radar Imagery VII; (2000) https://doi.org/10.1117/12.396341
Event: AeroSense 2000, 2000, Orlando, FL, United States

Abstract

This paper develops a method to model the two parameter Constant False Alarm Rate (CFAR) detector as an intensity test. For optimality we show that the shape of the stencil should be matched to the radial intensity profile of the target. Using principal component analysis (PCA) we show experimentally that the first gamma kernel is a good approximation to the target profile, which explains the good results of the (gamma) -CFAR detector, and may lead to configurable stencils for better detectability.

Citation Download Citation

LiKang Yen, Sashidhar Bhikkaji, and Jose C. Principe "Local intensity tests for optimal detectability", Proc. SPIE 4053, Algorithms for Synthetic Aperture Radar Imagery VII, (24 August 2000); https://doi.org/10.1117/12.396341

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available