Paper
24 August 2000 Classification performance prediction using parametric scattering feature models
Author Affiliations +
Abstract
We consider a method for estimating classification performance of a model-based synthetic aperture radar (SAR) automatic target recognition system. Target classification is performed by comparing an unordered feature set extracted from a measured SAR image chip with an unordered feature set predicted from a hypothesized target class and pose. A Bayes likelihood metric that incorporates uncertainty in both the predicted and extracted feature vectors is used to compute the match score. Evaluation of the match likelihoods requires a correspondence between the unordered predicted and extracted feature sets. This is a bipartite graph matching problem with insertions and deletions; we show that the optimal match can be found in polynomial time. We extend the results in 1 to estimate classification performance for a ten-class SAR ATR problem. We consider a synthetic classification problem to validate the classifier and to address resolution and robustness questions in the likelihood scoring method. Specifically, we consider performance versus SAR resolution, performance degradation due to mismatch between the assumed and actual feature statistics, and performance impact of correlated feature attributes.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hung-Chih Chiang, Randolph L. Moses, and Lee C. Potter "Classification performance prediction using parametric scattering feature models", Proc. SPIE 4053, Algorithms for Synthetic Aperture Radar Imagery VII, (24 August 2000); https://doi.org/10.1117/12.396365
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Feature extraction

Scattering

Synthetic aperture radar

Fourier transforms

Performance modeling

Image classification

Model-based design

Back to Top