Paper
21 July 2000 Coulomb image distortion in charge particle projection systems: scattering function of arbitrary image point
Boris G. Freinkman
Author Affiliations +
Abstract
The paper looks into the applicability of two models of Coulomb interactions -- space charge interaction and two particles interaction -- for image distortion calculations in the SCALPEL projection system. In contrast to [1-3], the paper takes into consideration the electron beam structure which is determined by the image structure, focus and astigmatism conditions. The calculations show that with the increasing electron current the space charge interaction becomes stronger than two particle interactions. In a qualitative sense spherical aberrations caused by Coulomb interactions are the same in the both models. The inference is that a Coulomb decrease in resolution in this particular system is largely due to space charge interactions. The calculations of the central point spread show that the resolution can be increased several times by correctly choosing the location of the image plane. With the beam energy of 100 kV and current of 50 (mu) A the highest resolution is 25 nm.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Boris G. Freinkman "Coulomb image distortion in charge particle projection systems: scattering function of arbitrary image point", Proc. SPIE 3997, Emerging Lithographic Technologies IV, (21 July 2000); https://doi.org/10.1117/12.390109
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KEYWORDS
Particles

Scattering

Projection systems

Distortion

Laser scattering

Charged-particle lithography

Image resolution

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