Paper
22 June 2000 Design and testing of a mesoscale actuator device (MAD)
Joon Park, Milan Mitrovic, Gregory Paul Carman, H. Thomas Hahn
Author Affiliations +
Abstract
Three different piezoelectric stacks (PI, NEC, and Marco stack) were characterized in this paper. Their mechanical and electrical properties were first evaluated including Young' modulus, piezoelectric constants, and effective permittivity under mechanical preloads up to 69 MPa (10 ksi) at 2 MV/m. Test result shows that the PI stack generated the highest strain output (2087 με) under a mechanical preload of 55 MPa (8 ksi) at 2 MV/m. As electric field and frequency increased, piezoelectric stack was heated. Heating is mainly caused by power dissipated due to dielectric loss. The power density of the piezoelectric stack was measured under different frequencies, electric fields, and mechanical loads based on a factorial experimental design. Test results indicate that operational frequency influenced the power density more significantly than other parameters.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joon Park, Milan Mitrovic, Gregory Paul Carman, and H. Thomas Hahn "Design and testing of a mesoscale actuator device (MAD)", Proc. SPIE 3985, Smart Structures and Materials 2000: Smart Structures and Integrated Systems, (22 June 2000); https://doi.org/10.1117/12.388880
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Cited by 6 scholarly publications.
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KEYWORDS
Temperature metrology

Dielectrics

Actuators

Coating

Aluminum

Amplifiers

Convection

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