Paper
1 September 1999 Mainstreaming SOI CMOS technology
Ghavam G. Shahidi
Author Affiliations +
Abstract
Partially-depleted deep sub-micron CMOS on SOI technology is becoming a mainstream technology. This technology offers 20- 35 percent performance gain over a bulk technology implemented with the same tool set. In this paper, first a review of the SOI technology is given. Next, the partially- depleted SOI device and the reasons why it was chosen over fully depleted SOI device are reviewed. The sources of performance gain on SOI, and SOI-unique circuit issues that a designer must consider and account are discussed next. Finally, a low-power application of SOI is reviewed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ghavam G. Shahidi "Mainstreaming SOI CMOS technology", Proc. SPIE 3881, Microelectronic Device Technology III, (1 September 1999); https://doi.org/10.1117/12.360562
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
CMOS technology

Molybdenum

Semiconducting wafers

Switching

Capacitive coupling

Ionization

Manufacturing

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