Paper
30 December 1999 Proposed successor to barcode for automated reticle identification
Thomas White, Winthrop A. Baylies, Karl Andrew Bernal, John Merva, William Bouvier
Author Affiliations +
Abstract
Automated reticle identification faces new challenges as the industry approaches the arrival of 300 mm wafer fabs and the possible introduction of 230 mm reticles. Data Matrix is a useful and established encoding format, and is proposed as a successor to current barcode formats. The Data Matrix feasibility experiment is described and results discussed.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Thomas White, Winthrop A. Baylies, Karl Andrew Bernal, John Merva, and William Bouvier "Proposed successor to barcode for automated reticle identification", Proc. SPIE 3873, 19th Annual Symposium on Photomask Technology, (30 December 1999); https://doi.org/10.1117/12.373380
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KEYWORDS
Reticles

Data modeling

Photomasks

Semiconducting wafers

Computer programming

Semiconductors

Patents

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