Optical sensor for measurement of roll + pitch + yaw angles over large distances with high accuracy

Rainer Treichel; Rainer Sesselmann; Joachim Krieger

doi:10.1117/12.364285

21 September 1999 Optical sensor for measurement of roll + pitch + yaw angles over large distances with high accuracy

Rainer Treichel, Rainer Sesselmann, Joachim Krieger

Proceedings Volume 3824, Optical Measurement Systems for Industrial Inspection; (1999) https://doi.org/10.1117/12.364285
Event: Industrial Lasers and Inspection (EUROPTO Series), 1999, Munich, Germany

Abstract

There are applications, where the relative orientation, i.e. the roll-, pitch-, yaw angles, between a reference system and a far distant object system must be known. If the systems are closed together, for example, the rotational encoder is a standard instrument to measure the roll angle. For large distances (up to intersatellite distances) this optical sensor is able to measure the roll angle between both systems with an accuracy of about 1 arcsec within a range of plus or minus 30 degrees. The measurement principle is based on the reception and evaluation of the transmitted polarization plane according to the law of Malus. Replacing one photodiode with a position- sensing detector (PSD), the other two degrees of freedom can be also measured with similar accuracy within a range of about plus or minus 5 degrees. The present sensor principle is characterized by the application of amplitude- and polarization modulation with two perpendicular linear polarized laser diodes in the transmitter and evaluation of the signals with a suitable algorithm. The advantage of the sensor is that it becomes insensitive to stray light, intensity fluctuations of the laser diodes, responsivity fluctuations of the photodiodes and the p-s transmission splitting due to non-perpendicular incident light.

Citation Download Citation

Rainer Treichel, Rainer Sesselmann, and Joachim Krieger "Optical sensor for measurement of roll + pitch + yaw angles over large distances with high accuracy", Proc. SPIE 3824, Optical Measurement Systems for Industrial Inspection, (21 September 1999); https://doi.org/10.1117/12.364285

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available