The resistance to oxidation and cracking of metal-Te-Se recording films and their mechanisms have been studied. The metals included In, Pb, Sn, Bi, and Sb. The films were deposited by multi-source, high-speed rotary evaporation on substrates with glass-U.V. light curing resin-cellulose nitrate or acetate structures. The role of Se is to inhibit the oxidation and the role of metallic elements are to inhibit cracking and to decrease noise in reproduced signals by making crystal grains smaller. Selection of substrate surface material, especially selection of U.V.light curing resin, is also important to avoid oxidation of the recording film. Depth profiles of the recording films have been analyzed by Auger electron spectroscopy and X-ray photoelectron spectroscopy to clarify the mechanisms of oxidation inhibition.
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