Paper
13 October 1999 Evidence of enhanced fluorescence via cross coupling in an integrated thin-film fluorescence sensor
Meg L. Tuma, Russell W. Gruhlke, Thomas G. Brown
Author Affiliations +
Abstract
A fluorescence sensor-system has been proposed that integrates optical and electronic components in a thin-film geometry. Predicted properties of this sensor include: increased sensitivity, shielding form unwanted radiation, wavelength filtering, potential operation at high temperatures, and miniaturization. The sensor can be tuned to measure a wide variety of species by varying its thin- film corrugation period. The optical properties of the sensor are determined, in large part, by optical cross coupling through a corrugated metal film and enhanced fluorescence. Measurements evaluating these processes are presented.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Meg L. Tuma, Russell W. Gruhlke, and Thomas G. Brown "Evidence of enhanced fluorescence via cross coupling in an integrated thin-film fluorescence sensor", Proc. SPIE 3783, Optical Diagnostics for Fluids/Heat/Combustion and Photomechanics for Solids, (13 October 1999); https://doi.org/10.1117/12.365754
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Sensors

Luminescence

Metals

Photoresist materials

Thin films

Silver

Dielectrics

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