Paper
27 October 1999 PPLN laser-based system for chemical imaging
Peter D. Ludowise, David K. Ottesen, Thomas J. Kulp, Uta-Barbara Goers, Mathias C. Celina, Karla Armstrong, Sarah W. Allendorf
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Abstract
An infrared-imaging instrument is being developed to provide in situ qualitative and quantitative assessment of hydrocarbon contaminants on metallic surfaces for cleaning verification. A continuous-wave infrared optical parametric oscillator (OPO), based on the quasi-phasematched material periodically poled lithium niobate (PPLN), is interfaced with an InSb focal plane array camera to perform fast, non-invasive analysis by reflectance spectroscopy. The period range of the designed fan-out PPLN crystal determines the range of the output wavelength of the light source. It is able to scan hundreds of wavenumbers positioned in the range of 2820 - 3250 cm-1, which is sufficient to detect functional groups of common organic compounds (-CH, -OH, and -NH). The capability of the instrument has been demonstrated in a preliminary investigation of reflectance measurements for hydrocarbon solvents (methanol and d-limonene) on an aluminum surface. A substantial difference in absorption is obtained for the two solvents at two different laser-illumination wavelengths, thus permitting hydrocarbon detection and molecular species differentiation. Preliminary reflectance spectra of a mixture of aliphatic hydrocarbon lubricants and drawing agents on an aluminum panel are also presented. The relative thickness of the hydrocarbon thin film is determined by the intensity ratio of images acquired at two different laser illumination frequencies.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter D. Ludowise, David K. Ottesen, Thomas J. Kulp, Uta-Barbara Goers, Mathias C. Celina, Karla Armstrong, and Sarah W. Allendorf "PPLN laser-based system for chemical imaging", Proc. SPIE 3753, Imaging Spectrometry V, (27 October 1999); https://doi.org/10.1117/12.366314
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KEYWORDS
Reflectivity

Aluminum

FT-IR spectroscopy

Imaging spectroscopy

Imaging systems

Absorption

Infrared radiation

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