Compact shearography system for the measurement of 3D deformation

Stephan Waldner; Stefan Brem

doi:10.1117/12.357771

17 August 1999 Compact shearography system for the measurement of 3D deformation

Stephan Waldner, Stefan Brem

Proceedings Volume 3745, Interferometry '99: Applications; (1999) https://doi.org/10.1117/12.357771
Event: International Conference on Optical Metrology, 1999, Pultusk Castle, Poland

Abstract

In this manuscript we present the development of an integrated shearography system that is able to measure the 3D deformation of an object surface. In order to determine all six displacement derivatives that may contribute to shearography results, six measurements with three different sensitivity directions and two shear directions have to be performed. The realized system is able to perform this measurement sequence in an automated way.

Citation Download Citation

Stephan Waldner and Stefan Brem "Compact shearography system for the measurement of 3D deformation", Proc. SPIE 3745, Interferometry '99: Applications, (17 August 1999); https://doi.org/10.1117/12.357771

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available