Paper
1 April 1999 Highly reliable 40-W cw InGaAlAs/GaAs 808-nm laser bars
Christian Hanke, Lutz Korte, Bruno D. Acklin, Johann Luft, Stefan Groetsch, Gerhard Herrmann, Zeljko Spika, Marcel Marchiano, Bernhard DeOdorico, Jens Wilhelmi
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Abstract
The fundamental question whether aluminum-free semiconductor lasers in the 808 nm band are significantly more reliable than Al-containing lasers is still open. We have fabricated and tested high-power InGaAlAs/GaAs-lasers which show excellent reliability data at and above 40 W cw. The laser structure consists of an InGaAlAs-double-quantum well (DQW) as active layer embedded in a large optical cavity (LOC) waveguide structure. The layers were grown in a low pressure MOVPE (LP- MOVPE) reactor using high quality precursors. Asymmetrically coated bars with a width of 1 cm containing 25 groups of 200 micrometer wide emitters were mounted junction down on actively cooled heatsinks. At a heatsink temperature of 18 degrees Celsius the slope-efficiency is 1.1 - 1.2 W/A. Due to the low series-resistance of 2.2 m(Omega) and the low internal losses in the range of 1.7 cm-1 the overall efficiency at 40 W cw reaches 50%. Lifetime studies over 33 0000 h accumulated device hours show that the laser bars with a resonator length of 900 micrometer can be operated at 40 W with high reliability. The mean degradation rate is -0.11%/kh. This result emphasizes that Al-containing lasers can also have a very high reliability usually claimed for Al-free lasers. As a consequence of these encouraging results we will start further lifetime tests at 50 to 60 W.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian Hanke, Lutz Korte, Bruno D. Acklin, Johann Luft, Stefan Groetsch, Gerhard Herrmann, Zeljko Spika, Marcel Marchiano, Bernhard DeOdorico, and Jens Wilhelmi "Highly reliable 40-W cw InGaAlAs/GaAs 808-nm laser bars", Proc. SPIE 3628, In-Plane Semiconductor Lasers III, (1 April 1999); https://doi.org/10.1117/12.344547
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Cited by 15 scholarly publications.
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KEYWORDS
Heatsinks

Reliability

Semiconductor lasers

Continuous wave operation

Oxygen

Resonators

High power lasers

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