Paper
26 March 1999 Thin films of LiNb0.5Ta0.5O3 prepared on SiO2/Si substrates by sol-gel processing
Shi De Cheng, Chan Hin Kam, Yan Zhou, Yee Loy Lam, Yuen Chuen Chan, Woon Siong Gan
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Abstract
In this paper, we report the preparation and characterization of sol-gel derived thin films of LiNb0.5Ta0.5O3 on the silica-on silicon substrate. The solution is prepared by mixing LiOC2H5, Nb(OC2H5)5 and Ta(OC2H5)5 and the thin films are prepared using spin coating. The films are annealed at different temperatures of 400, 500, 600, and 700 degrees Celsius. Our X-ray diffraction study show that the films are amorphous when annealed at 400 degrees Celsius and are crystallized over 500 degrees Celsius. The crystallized films are slightly a-axis oriented. Nanocrystalline grains with the size of about several tens of nanometers are observed in the crystallized films under an atomic force microscope, making the films potential candidates for electro-optical/acousto-optical applications.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shi De Cheng, Chan Hin Kam, Yan Zhou, Yee Loy Lam, Yuen Chuen Chan, and Woon Siong Gan "Thin films of LiNb0.5Ta0.5O3 prepared on SiO2/Si substrates by sol-gel processing", Proc. SPIE 3620, Integrated Optics Devices III, (26 March 1999); https://doi.org/10.1117/12.343731
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KEYWORDS
Crystals

Thin films

Sol-gels

Silicon

Atomic force microscopy

Annealing

Surface roughness

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