Refractive index profile reconstruction from near-field measurements: analysis and assessment

Guido Perrone; Gabriella Motta; Daniel Pircalaboiu; Frederica Cappelluti; Ivo Montrosset

doi:10.1117/12.343742

26 March 1999 Refractive index profile reconstruction from near-field measurements: analysis and assessment

Guido Perrone, Gabriella Motta, Daniel Pircalaboiu, Frederica Cappelluti, Ivo Montrosset

Proceedings Volume 3620, Integrated Optics Devices III; (1999) https://doi.org/10.1117/12.343742
Event: Optoelectronics '99 - Integrated Optoelectronic Devices, 1999, San Jose, CA, United States

Abstract

In this paper we present a critical analysis on the refractive index profile reconstruction from near field measurements. We show that the near field information is not sufficient to uniquely determine the proper index parameters if the refractive index shape it is not already known a priori and then we propose a technique to refine the results found from the inversion. Experimental verifications in the case of waveguides made by ion exchange in a glass substrate confirm the results obtained with simulations.

Citation Download Citation

Guido Perrone, Gabriella Motta, Daniel Pircalaboiu, Frederica Cappelluti, and Ivo Montrosset "Refractive index profile reconstruction from near-field measurements: analysis and assessment", Proc. SPIE 3620, Integrated Optics Devices III, (26 March 1999); https://doi.org/10.1117/12.343742

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