Testing method for CDs

Yi Zhang; Yuchang Lu; Duanyi Xu; Longfa Pan

doi:10.1117/12.318487

10 August 1998 Testing method for CDs

Yi Zhang, Yuchang Lu, Duanyi Xu, Longfa Pan

Proceedings Volume 3562, Optical Storage Technology; (1998) https://doi.org/10.1117/12.318487
Event: Photonics China '98, 1998, Beijing, China

Abstract

This paper provides a method to test some parameters of CDs. These parameters show the quality of the disks directly. The method is based on a commercial CD-ROM and a common computer. Some necessary circuits and software are added in. The analytic results can be provided.

Citation Download Citation

Yi Zhang, Yuchang Lu, Duanyi Xu, and Longfa Pan "Testing method for CDs", Proc. SPIE 3562, Optical Storage Technology, (10 August 1998); https://doi.org/10.1117/12.318487

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