Paper
10 August 1998 Magneto-optic enhancement effect of dielectric layer and influence of magnetic layer thickness in bilayer films
Xiaofei Yang, Zuoyi Li, Rui Xiong, Ying Xu, Gengqi Lin
Author Affiliations +
Proceedings Volume 3562, Optical Storage Technology; (1998) https://doi.org/10.1117/12.318493
Event: Photonics China '98, 1998, Beijing, China
Abstract
The analytical expression for the relationship between the eigenvalue and the total value of the Kerr rotation angle is given by adopting the superposion principle of the interference of light in the bilayer-structure coating with transparent dielectric. The mechanism for the enhancement of the Polar Kerr effect can be discussed. Moreover, comparisons with J. Zak' method and discussions of suitability for the expression have enabled the method validation.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiaofei Yang, Zuoyi Li, Rui Xiong, Ying Xu, and Gengqi Lin "Magneto-optic enhancement effect of dielectric layer and influence of magnetic layer thickness in bilayer films", Proc. SPIE 3562, Optical Storage Technology, (10 August 1998); https://doi.org/10.1117/12.318493
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KEYWORDS
Dielectrics

Magnetism

Molybdenum

Kerr effect

Reflectivity

Magneto-optics

Thin films

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