Automated optical inspection for high-speed electron in synchrotron accelerator

Congliang Guo; Tonghui Liu; Rongsheng Wang

doi:10.1117/12.318361

10 August 1998 Automated optical inspection for high-speed electron in synchrotron accelerator

Congliang Guo, Tonghui Liu, Rongsheng Wang

Proceedings Volume 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II; (1998) https://doi.org/10.1117/12.318361
Event: Photonics China '98, 1998, Beijing, China

Abstract

Automated optical inspection for accelerated electron beam in synchrotron accelerator or storage electron beam in storage ring is important method of electron beam diagnostic.It is also the very convenient aided method for us to se the real beam size and structure. In this paper, we will discuss the physical characters of detector and cable in both of electromagnet wave and photon beam. Our main study is how to measure the signal finest and how to transfer signal data into computer on-line fast enough. The system signal is relative to transfer model and photon sensor, and it is so easy to find a good real time beam signal for us to see moveable electron beam image as best as the system does. We can analysis the beam character and its parameters in one smart system. At the end, we introduce some analysis result and new design ideas. it will have more potential prospects on industry application and other applications.

Citation Download Citation

Congliang Guo, Tonghui Liu, and Rongsheng Wang "Automated optical inspection for high-speed electron in synchrotron accelerator", Proc. SPIE 3558, Automated Optical Inspection for Industry: Theory, Technology, and Applications II, (10 August 1998); https://doi.org/10.1117/12.318361

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