Paper
18 December 1998 Half-multiphase printing: a proposed throughput improvement on MEBES 4500
Wayne P. Shen
Author Affiliations +
Abstract
This paper proposes a simple writing method, named 'half multiphase printing,' to improve the throughput of the MEBES 4500 raster-scan photomask writer by 40 - 50% while maintaining the same edge accuracy. The concept is simple and easy to apply. It is expected to be a very useful writing mode, especially for those applications with 0.25 - 0.35 micrometer design rules where 0.04 - 0.08 micrometer design grids and PBS resist are still widely used throughout the industry.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wayne P. Shen "Half-multiphase printing: a proposed throughput improvement on MEBES 4500", Proc. SPIE 3546, 18th Annual BACUS Symposium on Photomask Technology and Management, (18 December 1998); https://doi.org/10.1117/12.332855
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KEYWORDS
Printing

Spiral phase plates

Photomasks

Photoresist processing

Critical dimension metrology

Optical proximity correction

Photomask technology

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