Paper
29 December 1998 Speckle-induced phase error in laser-based phase-shifting projected-fringe profilometry
Hongyu Liu, Guowen Lu, Jonathan Jones, Daniel Komisarek, Shudong Wu
Author Affiliations +
Proceedings Volume 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV; (1998) https://doi.org/10.1117/12.334351
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States
Abstract
Although laser sources offer more advantages over white light sources in some phase-shifting projected fringe profilometry applications, these advantages are at the cost of speckle. This paper presents some basic statistics of the speckle-induced phase measurement errors that are investigated based on the multiplicative-noise model for image-plane speckles. The dependence of the phase error distribution and measurement uncertainty on the speckle size and grating pitch is found based on the Karhunen-Loeve expansion of speckle field. This analysis shows that phase errors caused by speckles can be modeled as additive white Gaussian noise. Based on these simulation results we can discuss the designs of the optical system and noise reduction algorithms.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongyu Liu, Guowen Lu, Jonathan Jones, Daniel Komisarek, and Shudong Wu "Speckle-induced phase error in laser-based phase-shifting projected-fringe profilometry", Proc. SPIE 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (29 December 1998); https://doi.org/10.1117/12.334351
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Error analysis

Phase shifts

Speckle

Optical design

Computer simulations

Laser sources

Light sources

Back to Top