Paper
29 December 1998 Dimensional measurement of plate products using a novel moire system
Jussi Paakkari, Heikki J. Ailisto
Author Affiliations +
Proceedings Volume 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV; (1998) https://doi.org/10.1117/12.334321
Event: Photonics East (ISAM, VVDC, IEMB), 1998, Boston, MA, United States
Abstract
In this paper we present a novel system concept for large scale flatness and dimensional measurement applications. This system has several advantages over traditional projection moire systems. The system has a robust optomechanical structure which avoids the tight mounting tolerances seen in current projection moire implementations. This means that the system concept will be more applicable to installations in a hostile production environment, at lower cost. The system can be installed close to the object under measurement and produces a good quality moire signal on variable surfaces including impurities, texture, markings, etc. The competitiveness of the flatness measurement system is increased by building a multipurpose system and adding such measurements as edges, width or surface quality to the same unit.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jussi Paakkari and Heikki J. Ailisto "Dimensional measurement of plate products using a novel moire system", Proc. SPIE 3520, Three-Dimensional Imaging, Optical Metrology, and Inspection IV, (29 December 1998); https://doi.org/10.1117/12.334321
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KEYWORDS
Moire patterns

Tolerancing

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