Paper
11 December 1998 Simulating radar altimeter waveforms for precise retrieval of sea surface parameters
Antonio Bartoloni, Cristina Celani, Nicola Monti, Nazzareno Pierdicca, Nicola Santantonio
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Abstract
The simulation of radar altimeter echoes is a fundamental tool to set up an accurate ground processor for estimating ocean parameters. This paper arises from a thesis work based on the simulation approach proposed by Tateiba and Fujita. It is based on the specular point approximation of the electromagnetic scattering problem but in principle it does not require assumptions on the properties of the random surface and the transmitted signal. The more critical aspect of the proposed solution is the identification of the specular points within the area illuminated by the antenna that requires to impose the orthogonality among a generic optical ray emerging from the antenna and the local plane tangent to the surface. In this paper, we have reconsidered the mentioned approach. In particular, we have refined the method to search the specular points in order to improve its efficiency. We have tested the implementation of the algorithm for an isotropic Gaussian surface and compared the results to the waveforms derived by using the 'Brown model'. We have also retracked the simulated waveforms using a processing software developed by Telespazio S.p.A as a first attempt to use the simulator within an accurate processing chain for altimeter data. Moreover we have compared the statistics of the echo to what is expected from a completely developed speckle.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Antonio Bartoloni, Cristina Celani, Nicola Monti, Nazzareno Pierdicca, and Nicola Santantonio "Simulating radar altimeter waveforms for precise retrieval of sea surface parameters", Proc. SPIE 3496, Earth Surface Remote Sensing II, (11 December 1998); https://doi.org/10.1117/12.332725
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KEYWORDS
Radar

Antennas

Computer simulations

Software development

Electromagnetic scattering

Instrument modeling

Laminated object manufacturing

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