Paper
20 October 1998 CVD diamond wires and tips for x-ray detection: growth and characterization by SEM and micro-Raman spectroscopy
Claudio Manfredotti, F. Fizzotti, A. Lo Giudice, G. Mucera, P. Polesello, Ettore Vittone, G. Mariotto, C. Vinegoni, E. Cazzanelli
Author Affiliations +
Proceedings Volume 3484, Lasers in Synthesis, Characterization, and Processing of Diamond; (1998) https://doi.org/10.1117/12.328207
Event: Lasers in Synthesis, Characterization, and Processing of Diamond, 1997, Tashkent, Uzbekistan
Abstract
We present a systematic study of the growth of polycrystalline diamond thin films on W wires and tips by hot filament assisted chemical vapor deposition for x-ray detection purposes. We carry out correlations between scanning electron microscopy (SEM) observations and micro- Raman spectra, while varying different growth parameters. SEM observations show a uniform covering of the substrate, with growth rates ranging from 0.5 to 1.5 micrometers /h. All (mu) - R spectra show a well defined diamond peak at 1330.8-1333.7 cm-1 together with abroad structure at 1400-1600 cm-1 and a luminescence background extending over the whole scanned range. A close analysis shows that best quality is obtained with the lowest diameter substrates, at the lowest CH4 concentration and at a low pressure. Some depositions have been studied as x-ray detectors and their sensitivity at low energy and 6 MeV beam evaluated, showing a good response with respect to standard ionization chambers.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Claudio Manfredotti, F. Fizzotti, A. Lo Giudice, G. Mucera, P. Polesello, Ettore Vittone, G. Mariotto, C. Vinegoni, and E. Cazzanelli "CVD diamond wires and tips for x-ray detection: growth and characterization by SEM and micro-Raman spectroscopy", Proc. SPIE 3484, Lasers in Synthesis, Characterization, and Processing of Diamond, (20 October 1998); https://doi.org/10.1117/12.328207
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