Paper
14 October 1998 Radar images analysis for scattering surfaces characterization
Enrico Piazza
Author Affiliations +
Abstract
According to the different problems and techniques related to the detection and recognition of airplanes and vehicles moving on the Airport surface, the present work mainly deals with the processing of images gathered by a high-resolution radar sensor. The radar images used to test the investigated algorithms are relative to sequence of images obtained in some field experiments carried out by the Electronic Engineering Department of the University of Florence. The radar is the Ka band radar operating in the'Leonardo da Vinci' Airport in Fiumicino (Rome). The images obtained from the radar scan converter are digitized and putted in x, y, (pixel) co- ordinates. For a correct matching of the images, these are corrected in true geometrical co-ordinates (meters) on the basis of fixed points on an airport map. Correlating the airplane 2-D multipoint template with actual radar images, the value of the signal in the points involved in the template can be extracted. Results for a lot of observation show a typical response for the main section of the fuselage and the wings. For the fuselage, the back-scattered echo is low at the prow, became larger near the center on the aircraft and than it decrease again toward the tail. For the wings the signal is growing with a pretty regular slope from the fuselage to the tips, where the signal is the strongest.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Enrico Piazza "Radar images analysis for scattering surfaces characterization", Proc. SPIE 3462, Radar Processing, Technology, and Applications III, (14 October 1998); https://doi.org/10.1117/12.326767
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Radar

Scattering

Image analysis

Radar sensor technology

Sensors

Silicon

Electronics engineering

Back to Top