Scanning microscopy end station at the ESRF x-ray microscopy beamline

Ray Barrett; Burkhard Kaulich; Sebastian Oestreich; Jean Susini

doi:10.1117/12.330335

6 November 1998 Scanning microscopy end station at the ESRF x-ray microscopy beamline

Ray Barrett, Burkhard Kaulich, Sebastian Oestreich, Jean Susini

Proceedings Volume 3449, X-Ray Microfocusing: Applications and Techniques; (1998) https://doi.org/10.1117/12.330335
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The ID21 x-ray microscopy beamline at the ESRF has two branchlines: one is dedicated to scanning microscopy techniques and the second to full-field imaging microscopy. The scanning x-ray microscope end station is designed for use over a relatively wide spectral range ranging from 0.2 to 8keV giving access to absorption edges from a wide range of elements of interest in both the biological and materials sciences. The microscope is operating initially with Fresnel zone plate optics and, apart from conventional absorption contrast imaging, is designed to accept a variety of complementary imaging modes. In particular considerable effort has been made to optimize the design for spectromicroscopy using both fluorescence imaging and scanning of the primary x-ray probe energy for XANES imaging. A brief overview of the beamline design is given. This is followed by a discussion of the implications of both the source characteristics and the required wide spectral range upon the optical design of the microscope and, leading from this, the technological choices which have been made. Preliminary results obtained with the microscope are presented.

Citation Download Citation

Ray Barrett, Burkhard Kaulich, Sebastian Oestreich, and Jean Susini "Scanning microscopy end station at the ESRF x-ray microscopy beamline", Proc. SPIE 3449, X-Ray Microfocusing: Applications and Techniques, (6 November 1998); https://doi.org/10.1117/12.330335

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