Doubly focusing crystal analyzer for x-ray fluorescence holography

Stefano Marchesini; Michel Belakhovsky; Andreas K. Freund

doi:10.1117/12.332510

11 December 1998 Doubly focusing crystal analyzer for x-ray fluorescence holography

Stefano Marchesini, Michel Belakhovsky, Andreas K. Freund

Proceedings Volume 3448, Crystal and Multilayer Optics; (1998) https://doi.org/10.1117/12.332510
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Our goal was to prepare an X-ray Fluorescence Holography (XFH) experiment at ESRF, in which the holographic information is approximately 0.3% of the overall isotropic fluorescent radiation. This requires a very pure fluorescent signal and the highest possible count rate. Therefore, we designed a focusing analyzer system with large solid angle acceptance. It consists of a sagittally bent pyrolithic graphite crystals with large solid angle acceptance used in the parafocusing mode for the meridional plane. We successfully applied it to collect a large fraction of isotropically emitted Fe, Ni and Pd K_(alpha ) fluorescent photons with the [002] and [006] graphite reflections, respectively. After characterizing the phase space efficiency (angular acceptance, focal spot shape) of a 200 mm long, doubly focusing analyzer, we developed a full circular one (220 mm diameter) to increase the solid angle acceptance to approximately 2 10^-2 sr, in view of an XFH experiment on MBE grown thin films. This analyzer can be used more generally at K and L edges for atoms with Z greater than or equal to 20.

Citation Download Citation

Stefano Marchesini, Michel Belakhovsky, and Andreas K. Freund "Doubly focusing crystal analyzer for x-ray fluorescence holography", Proc. SPIE 3448, Crystal and Multilayer Optics, (11 December 1998); https://doi.org/10.1117/12.332510

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