Structural and chemical analysis of grain boundaries and tellurium precipitates in commerical Cd1-xZnxTe

Jason R. Heffelfinger; Douglas L. Medlin; Ralph B. James

doi:10.1117/12.312902

1 July 1998 Structural and chemical analysis of grain boundaries and tellurium precipitates in commerical Cd1-xZnxTe

Jason R. Heffelfinger, Douglas L. Medlin, Ralph B. James

Proceedings Volume 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications; (1998) https://doi.org/10.1117/12.312902
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

The structure and chemistry of grain boundaries in commercial Cd_1-xZn_xTe, prepared by the high- pressure Bridgman technique, have been analyzed using transmission electron microscopy, scanning electron microscopy, infrared-light microscopy and visible-light microscopy. These analyses show that the grain boundaries inside the Cd_1-xZn_xTE materials are decorated with tellurium precipitates. Analysis of a tellurium precipitate at a grain boundary by transmission electron microscopy and selected-area electron diffraction found the precipitate to consist of a single, saucer-shaped grain. Electron diffraction from the precipitate was consistent with the trigonal phase of tellurium (space group P3,21), which is the equilibrium phase at room temperature and atmospheric pressure. This precipitate was found to be aligned with one of the adjacent CZT grains such that the tellurium (0111) planes were nearly parallel to the CZT (111) planes. High-resolution transmission electron microscopy of the Te/Cd_1-xZn_xTe interface showed no tertiary phase at the interface. The structures of the grain boundaries and the Te/Cd_1-xZn_xTe interface are discussed and related to their possible implications on Cd_1-xZn_xTe gamma-ray detector performance.

Citation Download Citation

Jason R. Heffelfinger, Douglas L. Medlin, and Ralph B. James "Structural and chemical analysis of grain boundaries and tellurium precipitates in commerical Cd1-xZnxTe", Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); https://doi.org/10.1117/12.312902

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