Paper
10 November 1998 Calibration and modeling of the SODART-OXS Bragg spectrometer on board the SRG satellite
Ingolf Halm, Hans-Joachim Wiebicke, Finn Erland Christensen, Peter K. Frederiksen, Ib Lundgaard Rasmussen
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Abstract
The SODART x-ray telescope includes an objective crystal spectrometer (OXS) providing a high energy resolving power by Bragg reflection upon crystals. To cover a wide energy range, 3 types of natural crystals, and a Co/C multilayer structure upon Si are used in the ranges 5-11 keV, 2-5 keV, 0.5-1.2 keV, and 0.16-0.42 keV. All types of crystal besides Si being an ideal crystal have been calibrated individually and after gluing onto the Bragg panel. The x-ray calibration procedures and result are discussed below. A ray-tracing program using the OXS calibration data and simulating the x- ray photon reflection on the mentioned crystals and the multilayers has been developed and is described also.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ingolf Halm, Hans-Joachim Wiebicke, Finn Erland Christensen, Peter K. Frederiksen, and Ib Lundgaard Rasmussen "Calibration and modeling of the SODART-OXS Bragg spectrometer on board the SRG satellite", Proc. SPIE 3445, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, (10 November 1998); https://doi.org/10.1117/12.330271
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KEYWORDS
Crystals

Laser induced fluorescence

Calibration

Photonic crystals

Silicon

Telescopes

X-rays

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