Paper
27 October 1998 Evaluation of siliconic paint contamination effects on optical surfaces exposed to the space environment
Moshe Shiloh, Eitan Grossman, Yoram Noter, Yeshayahu Lifshitz
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Abstract
Outgassing products originating from white siliconic paint were deposited on optical surfaces. The contamination layer was then exposed to vacuum UV (VUV) radiation. The volatile fragments generated by the paint outgassing as well as the UV irradiation were studied using a residual gas analyzer. The VUV effect on the contamination layer was studied by measuring the etching rate, measuring changes in the chemical state and measuring degradation in the optical transparency by UV-VIS photospectroscopy. Compiling the data obtained from the various analytical techniques it was concluded that the main erosion mechanism was crosslinking of the siliconic polymer chains. The crosslinking behavior induced fixation of the contamination layer, caused 'crystallization' of its liquid like form and degradation in its optical transparency.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Moshe Shiloh, Eitan Grossman, Yoram Noter, and Yeshayahu Lifshitz "Evaluation of siliconic paint contamination effects on optical surfaces exposed to the space environment", Proc. SPIE 3427, Optical Systems Contamination and Degradation, (27 October 1998); https://doi.org/10.1117/12.328506
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Cited by 4 scholarly publications.
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KEYWORDS
Contamination

Silicon

Vacuum ultraviolet

Ultraviolet radiation

Crystals

Transparency

Etching

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