Novel statistical calibration method for laser scanners

Jerry Xiaoming Chen; Yung-Tsai Chris Yen

doi:10.1117/12.328463

30 October 1998 Novel statistical calibration method for laser scanners

Jerry Xiaoming Chen, Yung-Tsai Chris Yen

Proceedings Volume 3426, Scattering and Surface Roughness II; (1998) https://doi.org/10.1117/12.328463
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

Calibration of laser scanner is usually a complicated procedure and is only carried out in the manufacture site. Here we report a new statistical calibration method that is simple and easy. It can be carried out in either customer or manufacture site. This new approach is much more accurate than the current factory calibration method.

Citation Download Citation

Jerry Xiaoming Chen and Yung-Tsai Chris Yen "Novel statistical calibration method for laser scanners", Proc. SPIE 3426, Scattering and Surface Roughness II, (30 October 1998); https://doi.org/10.1117/12.328463

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