Laser-scanning vibrometry for defect analysis

Heinz Franke; Lothar Zipser

doi:10.1117/12.307733

1 June 1998 Laser-scanning vibrometry for defect analysis

Heinz Franke, Lothar Zipser

Proceedings Volume 3411, Third International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; (1998) https://doi.org/10.1117/12.307733
Event: Third International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 1998, Ancona, Italy

Abstract

A novel method for identifying hidden defects in new products or in worn but valuable recyclable components is described. This method is based on the fact that the vibration behavior of mechanical objects is influenced by defects or material fatigue. For detecting hidden defects the vibration frame of the objects is scanned with a laser- scanning vibrometer. The scanned information is analyzed in an image processing unit. At last a quality evaluation is made.

Citation Download Citation

Heinz Franke and Lothar Zipser "Laser-scanning vibrometry for defect analysis", Proc. SPIE 3411, Third International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, (1 June 1998); https://doi.org/10.1117/12.307733

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