Paper
21 August 1998 Grisms from germanium/silicon for astronomical instruments
Hans-Ulrich Kaeufl, Karl Kuehl, Steffan Vogel
Author Affiliations +
Abstract
An overview on the use of grisms from high refractive index optical materials is given. When using grisms manufactured from silicon or germanium two IR focal-reducers of the European Southern Observatory (ESO) can serve as medium resolution echelle spectrometers. A silicon echelle grism allowing for a spectral resolution of 5000 for a 1 arcsec slit is being developed for SOFI, a near IR instrument featuring a 1024 Rockwell HgCdTe detector at ESO's 3.5m New Technology Telescope. For TIMMI2, ESO's new 10/20 micrometers instrument for the 3.6m telescope a germanium echelle grism is being built. For TIMMI a 10 micrometers camera featuring a 64 X 64 detector a low resolution germanium grism yielding a spectral resolution (lambda) /(Delta) (lambda) equals 200 for a 1 arcsec slit has already been successfully commissioned. The manufacturing process, the status and performances will be presented. Moreover we show some astronomical results.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hans-Ulrich Kaeufl, Karl Kuehl, and Steffan Vogel "Grisms from germanium/silicon for astronomical instruments", Proc. SPIE 3354, Infrared Astronomical Instrumentation, (21 August 1998); https://doi.org/10.1117/12.317257
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Cited by 9 scholarly publications.
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KEYWORDS
Manufacturing

Silicon

Optics manufacturing

Germanium

Prisms

Spectral resolution

Semiconducting wafers

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