Paper
1 January 1998 Heterodyne interferometer for measurement of linear displacements of a rough sample
Author Affiliations +
Proceedings Volume 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics; (1998) https://doi.org/10.1117/12.301329
Event: Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, 1996, Karpacz, Poland
Abstract
Theoretical background of a heterodyne interferometer to measure linear displacements of a rough surface is presented. The surface of a sample is illuminated by two laser beams having mutually slightly shifted frequencies by using acousto- optic modulators. The essential parameters of the system measuring in-plane and out-of-plane displacement are discussed.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tomasz S. Tkaczyk and Romulad Jozwicki "Heterodyne interferometer for measurement of linear displacements of a rough sample", Proc. SPIE 3320, Tenth Polish-Czech-Slovak Optical Conference: Wave and Quantum Aspects of Contemporary Optics, (1 January 1998); https://doi.org/10.1117/12.301329
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KEYWORDS
Sensors

Heterodyning

Signal detection

Interferometers

Interferometry

Phase measurement

Speckle

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