Paper
1 February 1998 Polar-dependent deformation of director near the dielectric pore in the metal-dielectric-nematic-metal structure
Ivanovich Mikhola Gritsenko, Sergey Ivanovich Kucheev
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Abstract
Polar-dependent deformation of NLC in the region of the pore of the structure Metal-Dielectric-NLC-Metal is investigate. It is shown that polar-dependent character of deformation is due to charge polarization and injection processes. The monopolar current value is about 10-11- 10-13A. The selective charge accumulation induced coated film brings about a homeotropic transition or stabilization of planar oriented nematic 5CB respectively. It is shown that the NLC method tests the through like pores only.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ivanovich Mikhola Gritsenko and Sergey Ivanovich Kucheev "Polar-dependent deformation of director near the dielectric pore in the metal-dielectric-nematic-metal structure", Proc. SPIE 3318, Liquid Crystals: Physics, Technology, and Applications, (1 February 1998); https://doi.org/10.1117/12.299979
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KEYWORDS
Dielectrics

Liquid crystals

Silicon

Dielectric polarization

Switching

Electro optical modeling

Electro optics

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