Coarse Aspheric Metrology

Evan Stryjewski; Audrey Michaelis

doi:10.1117/12.934261

27 May 1982 Coarse Aspheric Metrology

Evan Stryjewski, Audrey Michaelis

Proceedings Volume 0330, Optical Systems Engineering II; (1982) https://doi.org/10.1117/12.934261
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Precision scanning of fringes between a concave test plate and a convex aspheric mirror brought the mirror from a sphere to within λ/4 of its final figure. This was achieved while maintaining control of the vertex radius. Description of hardware and data reduction techniques will be presented.

Citation Download Citation

Evan Stryjewski and Audrey Michaelis "Coarse Aspheric Metrology", Proc. SPIE 0330, Optical Systems Engineering II, (27 May 1982); https://doi.org/10.1117/12.934261

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