Uniformity and performance of selectively oxidized VCSEL arrays

Kent M. Geib; Kent D. Choquette; Hong Q. Hou; B. Eugene Hammons

doi:10.1117/12.305447

20 April 1998 Uniformity and performance of selectively oxidized VCSEL arrays

Kent M. Geib, Kent D. Choquette, Hong Q. Hou, B. Eugene Hammons

Proceedings Volume 3286, Vertical-Cavity Surface-Emitting Lasers II; (1998) https://doi.org/10.1117/12.305447
Event: Optoelectronics and High-Power Lasers and Applications, 1998, San Jose, CA, United States

Abstract

We report the uniformity characteristics of low threshold of 1060 nm and high power 850 nm 8 X 8 individually addressable oxide-confined VCSEL arrays. Uniformity of lasing thresholds and operating characteristics are described, as well as thermal issues for 2D laser arrays.

Citation Download Citation

Kent M. Geib, Kent D. Choquette, Hong Q. Hou, and B. Eugene Hammons "Uniformity and performance of selectively oxidized VCSEL arrays", Proc. SPIE 3286, Vertical-Cavity Surface-Emitting Lasers II, (20 April 1998); https://doi.org/10.1117/12.305447

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