Effects of native oxides and optical confinement on microactivity VCSEL spontaneous emission

John P. Loehr; Michael J. Noble; James A. Lott

doi:10.1117/12.316736

7 July 1998 Effects of native oxides and optical confinement on microactivity VCSEL spontaneous emission

John P. Loehr, Michael J. Noble, James A. Lott

Proceedings Volume 3283, Physics and Simulation of Optoelectronic Devices VI; (1998) https://doi.org/10.1117/12.316736
Event: Optoelectronics and High-Power Lasers and Applications, 1998, San Jose, CA, United States

Abstract

Threshold currents in small-aperture VCSELs are likely to be dominated by diffraction losses. We have developed a semianalytic technique to estimate the lasing mode energies, field profiles and cavity losses--including absorption, mirror, and diffraction losses--in oxide-apertured VCSELs. By coupling these modes to the full, nonparabolic electronic bandstructure, and by solving the resulting multimode related rate equations, we can model the light versus current characteristics of microcavity VCSELs. We apply our model to a low-threshold VCSEL structure and calculate threshold currents of 30 - 40 (mu) A, in qualitative agreement with experiments. We estimate spontaneous emission factors (beta) as large as 1.7 X 10^-2 for a 1.5 micrometers radius device.

Citation Download Citation

John P. Loehr, Michael J. Noble, and James A. Lott "Effects of native oxides and optical confinement on microactivity VCSEL spontaneous emission", Proc. SPIE 3283, Physics and Simulation of Optoelectronic Devices VI, (7 July 1998); https://doi.org/10.1117/12.316736

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