Spectral Emittance Measurements Of Thin Films

Donald L. Stierwalt

doi:10.1117/12.933300

29 April 1982 Spectral Emittance Measurements Of Thin Films

Donald L. Stierwalt

Proceedings Volume 0325, Optical Thin Films; (1982) https://doi.org/10.1117/12.933300
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Infrared spectral emittance measurements can be used to determine the optical characteristics of thin films. The method is discussed and some examples are presented.

Citation Download Citation

Donald L. Stierwalt "Spectral Emittance Measurements Of Thin Films", Proc. SPIE 0325, Optical Thin Films, (29 April 1982); https://doi.org/10.1117/12.933300

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