Near-field light microscopy with SEM light generation

Vil B. Baiburin; Nikolai P. Konnov; Anatolyi A. Shcherbakov; Alina N. Malakhaeva; Yuri P. Volkov

doi:10.1117/12.297977

29 December 1997 Near-field light microscopy with SEM light generation

Vil B. Baiburin, Nikolai P. Konnov, Anatolyi A. Shcherbakov, Alina N. Malakhaeva, Yuri P. Volkov

Proceedings Volume 3197, Optical Biopsies and Microscopic Techniques II; (1997) https://doi.org/10.1117/12.297977
Event: BiOS Europe '97, 1997, San Remo, Italy

Abstract

A new near field light microscope with SEM light generation (NFLEM) has been developed on the basis of modified SEM (Hitachi HU-12A). The scanning electron beam of the SEM passed through thin luminescent film coating a sample generates a small light spot. The light transmitted through the sample is registered by PMT. The wavelength of the light can be easily modified (from infrared to x-ray) by changing the luminescent film. The images of test objects (latex 0.1 micrometer, thin metal films) are obtained by the microscope.

Citation Download Citation

Vil B. Baiburin, Nikolai P. Konnov, Anatolyi A. Shcherbakov, Alina N. Malakhaeva, and Yuri P. Volkov "Near-field light microscopy with SEM light generation", Proc. SPIE 3197, Optical Biopsies and Microscopic Techniques II, (29 December 1997); https://doi.org/10.1117/12.297977

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available