Multiple fluorescence microscopy and optoelectronic imaging: possibilities and limits

Heinz Gundlach

doi:10.1117/12.297968

29 December 1997 Multiple fluorescence microscopy and optoelectronic imaging: possibilities and limits

Heinz Gundlach

Proceedings Volume 3197, Optical Biopsies and Microscopic Techniques II; (1997) https://doi.org/10.1117/12.297968
Event: BiOS Europe '97, 1997, San Remo, Italy

Abstract

The last 20 years have seen an unexpected great renaissance and a partial revolution in light microscopy. This recent progress is due to new design in optics and instrumentation as well as improvement of optical contrast enhancement techniques. Recent progress in fluorescence microscopy is achieved by multiparameter fluorescence techniques, by improvement of conventional photomicrography as well as by optoelectronic imaging, confocal laser scanning microscopy, image processing and analysis. Due to the increase in number of fluorescence dyes, double and triple bandpass filter sets permit a rapid changeover between different fluorochromes simultaneously.

Citation Download Citation

Heinz Gundlach "Multiple fluorescence microscopy and optoelectronic imaging: possibilities and limits", Proc. SPIE 3197, Optical Biopsies and Microscopic Techniques II, (29 December 1997); https://doi.org/10.1117/12.297968

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