Paper
26 August 1997 Thermodynamic aspects of manufacturing of (Hg,Mn)Te/CdTe structures
S. V. Kavertsev, Sergiy Mikhailovich Komirenko, L. V. Rashkovetskii, Alexander E. Belyaev
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Proceedings Volume 3182, Material Science and Material Properties for Infrared Optoelectronics; (1997) https://doi.org/10.1117/12.280462
Event: Material Science and Material Properties for Infrared Optoelectronics, 1996, Uzhgorod, Ukraine
Abstract
The comparison of actual manganese concentration in (Hg,Mn)Te samples grown by liquid phase epitaxy on CdTe and Cd0.96Zn0.04Te substrates to values obtained from the phase diagram of Hg-Mn-Te system reveals considerable discrepancies. The thermodynamic analysis made in assumption that the manganese concentration in the melting is low strained solid phase and superolled liquid one, i.e. the crystallization process is affected by elastic strain in epitaxial layer caused by lattice mismatch between substrate and film. It is shown also that the model of complete association in liquid phase do not provide a good agreement with experimental data.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. V. Kavertsev, Sergiy Mikhailovich Komirenko, L. V. Rashkovetskii, and Alexander E. Belyaev "Thermodynamic aspects of manufacturing of (Hg,Mn)Te/CdTe structures", Proc. SPIE 3182, Material Science and Material Properties for Infrared Optoelectronics, (26 August 1997); https://doi.org/10.1117/12.280462
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KEYWORDS
Liquid phase epitaxy

Thermodynamics

Manufacturing

Data modeling

Liquids

Manganese

Cadmium

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